{"id":996,"date":"2021-02-23T11:08:13","date_gmt":"2021-02-23T16:08:13","guid":{"rendered":"https:\/\/demo.irdq.ca\/produit\/atomic-force-microscopy-afm-multimode-8\/"},"modified":"2021-04-13T16:06:55","modified_gmt":"2021-04-13T20:06:55","slug":"atomic-force-microscopy-afm-multimode-8","status":"publish","type":"product","link":"https:\/\/demo.irdq.ca\/en\/equipements\/atomic-force-microscopy-afm-multimode-8\/","title":{"rendered":"Atomic Force Microscopy (AFM) (Multimode 8)"},"content":{"rendered":"

Additional information<\/h2>\n\n\n\n\n
MANUFACTURER<\/th>\nBruker<\/td>\n<\/tr>\n
MODEL<\/th>\nMultimode 8<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n

Applications<\/h3>\n

Atomic Force Microscopy (AFM) is a microscopy technique that allows to study the topography of a surface. For this, a very sharp tip (2 to 20 nm at its end) scans the sample surface. By detecting the interatomic forces between the tip and the sample, a 3D image of the surface is then reconstituted.<\/p>\n

Multimode 8 instrument is a very high resolution AFM dedicated to the study of small samples (DNA, RNA, proteins). It makes it possible to use several operating modes (contact, tapping, peak force tapping) in air and in liquid medium.<\/p>\n

Analyses<\/h3>\n
    \n
  • Modes\u00a0: contact, tapping, lateral force (LFM), magnetic force (MFM), tunneling (STM)<\/li>\n
  • Quantitative topographical measurements<\/li>\n
  • Qualitative viscoelastic measurements<\/li>\n
  • Lateral resolution: 2 nm<\/li>\n
  • Temperature control\u00a0: \u2264185 \u00b0C (ambient); \u2264 60 \u00b0C (liquid)<\/li>\n
  • Liquid cell<\/li>\n<\/ul>\n

    Applications<\/h3>\n
      \n
    • Topographical measurements in air or liquid milieu, measurement of mechanical properties, friction properties, roughness, magnetic gradients, electrical gradients, tip\/surface interaction forces, and electrochemical measurements.<\/li>\n<\/ul>\n","protected":false},"excerpt":{"rendered":"

      Additional information MANUFACTURER Bruker MODEL Multimode 8 Applications Atomic Force Microscopy (AFM) is a microscopy technique that allows to study the topography of a surface. For this, a very sharp tip (2 to 20 nm at its end) scans the sample surface. By detecting the interatomic forces between the tip and the sample, a 3D […]<\/p>\n","protected":false},"featured_media":997,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_et_pb_use_builder":"","_et_pb_old_content":"","_et_gb_content_width":""},"product_cat":[358,365],"product_tag":[616],"yoast_head":"\nAtomic Force Microscopy (AFM) (Multimode 8) | IRDQ<\/title>\n<meta name=\"robots\" content=\"noindex, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Atomic Force Microscopy (AFM) (Multimode 8) | IRDQ\" \/>\n<meta property=\"og:description\" content=\"Additional information MANUFACTURER Bruker MODEL Multimode 8 Applications Atomic Force Microscopy (AFM) is a microscopy technique that allows to study the topography of a surface. 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