{"id":987,"date":"2021-02-23T11:08:16","date_gmt":"2021-02-23T16:08:16","guid":{"rendered":"https:\/\/demo.irdq.ca\/produit\/atomic-force-microscopy-afm-enviroscope\/"},"modified":"2021-04-13T16:06:55","modified_gmt":"2021-04-13T20:06:55","slug":"atomic-force-microscopy-afm-enviroscope","status":"publish","type":"product","link":"https:\/\/demo.irdq.ca\/en\/equipements\/atomic-force-microscopy-afm-enviroscope\/","title":{"rendered":"Atomic Force Microscopy (afm) (Enviroscope)"},"content":{"rendered":"

Additional information<\/h2>\n\n\n\n\n
MANUFACTURER<\/th>\nVeeco<\/td>\n<\/tr>\n
MODEL<\/th>\nEnviroscope<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n

Samples<\/h3>\n
    \n
  • Samples size\u00a0: 50 mm maximum (measurement area\u00a0: 6 mm)<\/li>\n
  • Thickness: 12 mm maximum<\/li>\n<\/ul>\n

    Analysis<\/h3>\n
      \n
    • Modes: contact (defection feedback) and tapping modes<\/li>\n
    • Specially designed to perform measurements under controlled atmosphere (vacuum or inert gas), it is also equipped with auxiliary modules allowing electrical or electromechanical measurements<\/li>\n<\/ul>\n

      Applications<\/h3>\n
        \n
      • Routine topographical measurement<\/li>\n
      • Material contrast via the detection of friction\/adhesion or the cantilever vibration phase specific to each material<\/li>\n
      • Detection of materials piezoelectricity and elasticity<\/li>\n
      • Detection and control of the polarization of the piezoelectric response<\/li>\n
      • Mapping of resistance; of electrical and\/or magnetic gradients; of surface potential<\/li>\n<\/ul>\n

        Characteristics<\/h3>\n
          \n
        • Resolution: 1 nm<\/li>\n
        • Pressure: 10-5<\/sup> to 1400 mbar<\/li>\n
        • Noise: ~0.1 nm RMS (Z direction) with turbo pump<\/li>\n
        • Maximum scanning dimension: 90 \u00b5m (X) and 4 \u00b5m (Y)<\/li>\n
        • Additional signals during scanning: friction (contact mode), phase (tapping mode)<\/li>\n
        • Current measurement module: Preamplifier Femto (DLPCA 200) and DC current source (Keithley 2400).<\/li>\n
        • Current noise: < 0.5 pA.<\/li>\n
        • Electromechanical measurement module: Lock-in amplifier (Signal Recovery 7265) and DC current source (Keithley 2400).<\/li>\n
        • Noise for the piezoelectric response: < 0.1 pm\/V<\/li>\n<\/ul>\n

          ADVANCED TECHNIQUES<\/h3>\n
            \n
          • Lateral Electrostatic\/Magnetic Force Microscopy (EFM \/ MFM)<\/li>\n
          • Double scan mode with PLL loop to detect and follow the resonance frequency<\/li>\n
          • Kelvin probe microscopy (detection of surface potential)<\/li>\n<\/ul>\n","protected":false},"excerpt":{"rendered":"

            Additional information MANUFACTURER Veeco MODEL Enviroscope Samples Samples size\u00a0: 50 mm maximum (measurement area\u00a0: 6 mm) Thickness: 12 mm maximum Analysis Modes: contact (defection feedback) and tapping modes Specially designed to perform measurements under controlled atmosphere (vacuum or inert gas), it is also equipped with auxiliary modules allowing electrical or electromechanical measurements Applications Routine topographical […]<\/p>\n","protected":false},"featured_media":979,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_et_pb_use_builder":"","_et_pb_old_content":"","_et_gb_content_width":""},"product_cat":[358,365],"product_tag":[617],"yoast_head":"\nAtomic Force Microscopy (afm) (Enviroscope) | IRDQ<\/title>\n<meta name=\"robots\" content=\"noindex, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Atomic Force Microscopy (afm) (Enviroscope) | IRDQ\" \/>\n<meta property=\"og:description\" content=\"Additional information MANUFACTURER Veeco MODEL Enviroscope Samples Samples size\u00a0: 50 mm maximum (measurement area\u00a0: 6 mm) Thickness: 12 mm maximum Analysis Modes: contact (defection feedback) and tapping modes Specially designed to perform measurements under controlled atmosphere (vacuum or inert gas), it is also equipped with auxiliary modules allowing electrical or electromechanical measurements Applications Routine topographical […]\" \/>\n<meta property=\"og:url\" content=\"https:\/\/demo.irdq.ca\/equipements\/microscopie-a-force-atomique-afm-enviroscope\/\" \/>\n<meta property=\"og:site_name\" content=\"IRDQ\" \/>\n<meta property=\"article:modified_time\" content=\"2021-04-13T20:06:55+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/demo.irdq.ca\/wp-content\/uploads\/2021\/02\/icons-irdq-bg-1.jpg\" \/>\n\t<meta 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