{"id":985,"date":"2021-02-23T11:08:16","date_gmt":"2021-02-23T16:08:16","guid":{"rendered":"https:\/\/demo.irdq.ca\/produit\/atomic-force-microscopy-afm-nanoscope-iiia\/"},"modified":"2021-04-13T16:06:52","modified_gmt":"2021-04-13T20:06:52","slug":"atomic-force-microscopy-afm-nanoscope-iiia","status":"publish","type":"product","link":"https:\/\/demo.irdq.ca\/en\/equipements\/atomic-force-microscopy-afm-nanoscope-iiia\/","title":{"rendered":"Atomic Force Microscopy (afm) (Nanoscope IIIa)"},"content":{"rendered":"

Additional information<\/h2>\n\n\n\n\n
MANUFACTURER<\/th>\nVeeco<\/td>\n<\/tr>\n
MODEL<\/th>\nNanoscope IIIa<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n

Analyses<\/h3>\n
    \n
  • Modes\u00a0: contact, tapping<\/li>\n
  • Scan range: 120 \u00b5m (X-Y), 5 \u00b5m (Z)<\/li>\n
  • Depth resolution: 0.01 nm<\/li>\n
  • Lateral resolution: 0.1 nm<\/li>\n<\/ul>\n","protected":false},"excerpt":{"rendered":"

    Additional information MANUFACTURER Veeco MODEL Nanoscope IIIa Analyses Modes\u00a0: contact, tapping Scan range: 120 \u00b5m (X-Y), 5 \u00b5m (Z) Depth resolution: 0.01 nm Lateral resolution: 0.1 nm<\/p>\n","protected":false},"featured_media":979,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_et_pb_use_builder":"","_et_pb_old_content":"","_et_gb_content_width":""},"product_cat":[358,365],"product_tag":[617],"yoast_head":"\nAtomic Force Microscopy (afm) (Nanoscope IIIa) | IRDQ<\/title>\n<meta name=\"robots\" content=\"noindex, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Atomic Force Microscopy (afm) (Nanoscope IIIa) | IRDQ\" \/>\n<meta property=\"og:description\" content=\"Additional information MANUFACTURER Veeco MODEL Nanoscope IIIa Analyses Modes\u00a0: contact, tapping Scan range: 120 \u00b5m (X-Y), 5 \u00b5m (Z) Depth resolution: 0.01 nm Lateral resolution: 0.1 nm\" \/>\n<meta property=\"og:url\" content=\"https:\/\/demo.irdq.ca\/equipements\/microscopie-a-force-atomique-afm-nanoscope-iiia\/\" \/>\n<meta property=\"og:site_name\" content=\"IRDQ\" \/>\n<meta property=\"article:modified_time\" content=\"2021-04-13T20:06:52+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/demo.irdq.ca\/wp-content\/uploads\/2021\/02\/icons-irdq-bg-1.jpg\" \/>\n\t<meta property=\"og:image:width\" content=\"600\" \/>\n\t<meta property=\"og:image:height\" content=\"600\" \/>\n\t<meta property=\"og:image:type\" content=\"image\/jpeg\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<script type=\"application\/ld+json\" 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