{"id":982,"date":"2021-02-23T11:08:17","date_gmt":"2021-02-23T16:08:17","guid":{"rendered":"https:\/\/demo.irdq.ca\/produit\/scanning-electron-microscope-sem-jsm-7401f\/"},"modified":"2021-04-13T16:06:52","modified_gmt":"2021-04-13T20:06:52","slug":"scanning-electron-microscope-sem-jsm-7401f","status":"publish","type":"product","link":"https:\/\/demo.irdq.ca\/en\/equipements\/scanning-electron-microscope-sem-jsm-7401f\/","title":{"rendered":"Scanning Electron Microscope (sem) (JSM 7401F)"},"content":{"rendered":"

Additional information<\/h2>\n\n\n\n\n
MANUFACTURER<\/th>\nJEOL<\/td>\n<\/tr>\n
MODEL<\/th>\nJSM 7401F<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n

Samples<\/h3>\n
    \n
  • Sample size: 150 mm maximum<\/li>\n
  • Thickness: 5 mm maximum<\/li>\n<\/ul>\n

    Analysis<\/h3>\n
      \n
    • Acceleration: 0.1 keV to 30 keV<\/li>\n
    • Resolution : about 1 nm<\/li>\n<\/ul>\n

      Variants<\/h3>\n
        \n
      • Phase analysis by backscattered electron detection<\/li>\n
      • Energy Dispersive Spectrometer (EDS) for X-ray elemental analysis\u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0\u00a0<\/li>\n<\/ul>\n","protected":false},"excerpt":{"rendered":"

        Additional information MANUFACTURER JEOL MODEL JSM 7401F Samples Sample size: 150 mm maximum Thickness: 5 mm maximum Analysis Acceleration: 0.1 keV to 30 keV Resolution : about 1 nm Variants Phase analysis by backscattered electron detection Energy Dispersive Spectrometer (EDS) for X-ray elemental analysis\u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 […]<\/p>\n","protected":false},"featured_media":979,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_et_pb_use_builder":"","_et_pb_old_content":"","_et_gb_content_width":""},"product_cat":[358,365],"product_tag":[618],"yoast_head":"\nScanning Electron Microscope (sem) (JSM 7401F) | IRDQ<\/title>\n<meta name=\"robots\" content=\"noindex, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Scanning Electron 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