{"id":980,"date":"2021-02-23T11:08:17","date_gmt":"2021-02-23T16:08:17","guid":{"rendered":"https:\/\/demo.irdq.ca\/produit\/scanning-electron-microscope-sem-jsm-7600-tfe\/"},"modified":"2021-04-13T16:06:52","modified_gmt":"2021-04-13T20:06:52","slug":"scanning-electron-microscope-sem-jsm-7600-tfe","status":"publish","type":"product","link":"https:\/\/demo.irdq.ca\/en\/equipements\/scanning-electron-microscope-sem-jsm-7600-tfe\/","title":{"rendered":"Scanning Electron Microscope (sem) (JSM 7600 TFE)"},"content":{"rendered":"

Additional information<\/h2>\n\n\n\n\n
MANUFACTURER<\/th>\nJEOL<\/td>\n<\/tr>\n
MODEL<\/th>\nJSM 7600 TFE<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n

Samples<\/h3>\n
    \n
  • Equipped with a Field Effect Gun (FEG) for the observation of non-conducting samples<\/li>\n<\/ul>\n

    Analysis<\/h3>\n
      \n
    • High resolution surface imaging<\/li>\n
    • Lateral resolution : 1.4 nm at 1 kV and 1.0 nm at 15 kV<\/li>\n<\/ul>\n

      Characteristics<\/h3>\n
        \n
      • Instrument unique\u00a0 in Canada allowing the analysis of non-conducting samples at high resolution<\/li>\n<\/ul>\n

         <\/p>\n

        Variants<\/h3>\n

        Detection of back-scatted electrons for phase analysis<\/h4>\n
          \n
        • Lateral resolution : 3 nm at 1 kV<\/li>\n
        • Sample holder for non-conducting samples<\/li>\n<\/ul>\n

          Energy Dispersive Spectrometry (EDS) for chemical composition determination<\/h4>\n
            \n
          • Semi-quantitative and quantitative (with standards)<\/li>\n
          • Mapping possible<\/li>\n
          • Lateral resolution : of the order of one micrometer (depending on the material and the accelerating voltage)<\/li>\n
          • Applications : Elemental mapping, quantification of the chemical composition of a given phase<\/li>\n
          • Detection limit: about 0.1% atomic<\/li>\n<\/ul>\n

            Wavelength Dispersive Spectrometry (WDS) for chemical composition determination<\/h4>\n
              \n
            • Semi-quantitative and quantitative (with standards)<\/li>\n
            • Mapping possible<\/li>\n
            • Lateral resolution : of the order of one micrometer (depending on the material and the accelerating voltage)<\/li>\n
            • Applications : Elemental mapping, quantification of the chemical composition of a given phase<\/li>\n
            • Detection limit: about 0.1% atomic<\/li>\n<\/ul>\n","protected":false},"excerpt":{"rendered":"

              Additional information MANUFACTURER JEOL MODEL JSM 7600 TFE Samples Equipped with a Field Effect Gun (FEG) for the observation of non-conducting samples Analysis High resolution surface imaging Lateral resolution : 1.4 nm at 1 kV and 1.0 nm at 15 kV Characteristics Instrument unique\u00a0 in Canada allowing the analysis of non-conducting samples at high resolution […]<\/p>\n","protected":false},"featured_media":979,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_et_pb_use_builder":"","_et_pb_old_content":"","_et_gb_content_width":""},"product_cat":[358,365],"product_tag":[618],"yoast_head":"\nScanning Electron Microscope (sem) (JSM 7600 TFE) | IRDQ<\/title>\n<meta name=\"robots\" content=\"noindex, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Scanning Electron Microscope (sem) (JSM 7600 TFE) | IRDQ\" \/>\n<meta property=\"og:description\" content=\"Additional information MANUFACTURER JEOL MODEL JSM 7600 TFE Samples Equipped with a Field Effect Gun (FEG) for the observation of non-conducting samples Analysis High resolution surface imaging Lateral resolution : 1.4 nm at 1 kV and 1.0 nm at 15 kV Characteristics Instrument unique\u00a0 in Canada allowing the analysis of non-conducting samples at high resolution […]\" \/>\n<meta property=\"og:url\" content=\"https:\/\/demo.irdq.ca\/equipements\/microscopie-electronique-a-balayage-sem-jsm-7600-tfe\/\" \/>\n<meta property=\"og:site_name\" content=\"IRDQ\" \/>\n<meta property=\"article:modified_time\" content=\"2021-04-13T20:06:52+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/demo.irdq.ca\/wp-content\/uploads\/2021\/02\/icons-irdq-bg-1.jpg\" \/>\n\t<meta property=\"og:image:width\" content=\"600\" \/>\n\t<meta property=\"og:image:height\" content=\"600\" \/>\n\t<meta property=\"og:image:type\" 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