{"id":978,"date":"2021-02-23T11:08:17","date_gmt":"2021-02-23T16:08:17","guid":{"rendered":"https:\/\/demo.irdq.ca\/produit\/transmission-electron-microscope-tem\/"},"modified":"2021-04-13T16:06:52","modified_gmt":"2021-04-13T20:06:52","slug":"transmission-electron-microscope-tem","status":"publish","type":"product","link":"https:\/\/demo.irdq.ca\/en\/equipements\/transmission-electron-microscope-tem\/","title":{"rendered":"Transmission Electron Microscope (tem)"},"content":{"rendered":"

Additional information<\/h2>\n\n\n\n\n
MANUFACTURER<\/th>\nJEOL<\/td>\n<\/tr>\n
MODEL<\/th>\nJSM 2100-F<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n

Samples<\/h3>\n
    \n
  • Samples are prepared with an Focused Ion Beam dedicated to the preparation of thin lamellas<\/li>\n<\/ul>\n

    Analysis<\/h3>\n
      \n
    • High Resolution Imaging (dark and light background)<\/li>\n
    • Equipped with Field Effect Gun working with an acceleration voltage of 200 kV and 100 kV<\/li>\n
    • Lateral resolution : 0.19 nm<\/li>\n<\/ul>\n

      Characteristics<\/h3>\n
        \n
      • Instrument unique in Canada, equipped with a Field Effect Gun capable of a very high resolution for imaging, X-ray mapping and PEELS <\/li>\n<\/ul>\n

         <\/p>\n

        Variants<\/h3>\n

        Energy Dispersive Xray Spectrometry (EDS) for chemical analysis<\/h4>\n
          \n
        • Qualitative and quantitative analysis<\/li>\n
        • Mapping possible <\/li>\n<\/ul>\n

          Parallel Electron Energy Loss Spectroscopy (PEELS) for chemical analysis and thickness measurement<\/h4>\n
            \n
          • Qualitative and quantitative analysis<\/li>\n
          • Mapping possible<\/li>\n<\/ul>\n

            Crystallographic analysis<\/h4>\n","protected":false},"excerpt":{"rendered":"

            Additional information MANUFACTURER JEOL MODEL JSM 2100-F Samples Samples are prepared with an Focused Ion Beam dedicated to the preparation of thin lamellas Analysis High Resolution Imaging (dark and light background) Equipped with Field Effect Gun working with an acceleration voltage of 200 kV and 100 kV Lateral resolution : 0.19 nm Characteristics Instrument unique […]<\/p>\n","protected":false},"featured_media":979,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_et_pb_use_builder":"","_et_pb_old_content":"","_et_gb_content_width":""},"product_cat":[358,365],"product_tag":[615],"yoast_head":"\nTransmission Electron Microscope (tem) | IRDQ<\/title>\n<meta name=\"robots\" content=\"noindex, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Transmission Electron Microscope (tem) | IRDQ\" \/>\n<meta property=\"og:description\" content=\"Additional information MANUFACTURER JEOL MODEL JSM 2100-F Samples Samples are prepared with an Focused Ion Beam dedicated to the preparation of thin lamellas Analysis High Resolution Imaging (dark and light background) Equipped with Field Effect Gun working with an acceleration voltage of 200 kV and 100 kV Lateral resolution : 0.19 nm Characteristics Instrument unique […]\" \/>\n<meta property=\"og:url\" content=\"https:\/\/demo.irdq.ca\/equipements\/microscopie-electronique-en-transmission-tem\/\" \/>\n<meta property=\"og:site_name\" content=\"IRDQ\" \/>\n<meta property=\"article:modified_time\" content=\"2021-04-13T20:06:52+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/demo.irdq.ca\/wp-content\/uploads\/2021\/02\/icons-irdq-bg-1.jpg\" \/>\n\t<meta property=\"og:image:width\" content=\"600\" \/>\n\t<meta property=\"og:image:height\" content=\"600\" \/>\n\t<meta property=\"og:image:type\" content=\"image\/jpeg\" 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