{"id":1048,"date":"2021-02-23T11:08:06","date_gmt":"2021-02-23T16:08:06","guid":{"rendered":"https:\/\/demo.irdq.ca\/produit\/i-v-and-c-v-measurement-summit-12000\/"},"modified":"2021-04-13T16:07:00","modified_gmt":"2021-04-13T20:07:00","slug":"i-v-and-c-v-measurement-summit-12000","status":"publish","type":"product","link":"https:\/\/demo.irdq.ca\/en\/equipements\/i-v-and-c-v-measurement-summit-12000\/","title":{"rendered":"I\/V and C\/V Measurement (Summit 12000)"},"content":{"rendered":"

Additional information<\/h2>\n\n\n\n\n
MANUFACTURER<\/th>\nCascades<\/td>\n<\/tr>\n
MODEL<\/th>\nSummit 12000<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n

Samples<\/h3>\n
    \n
  • Sample sizes\u00a0: 200 mm maximum<\/li>\n<\/ul>\n

    Applications<\/h3>\n
      \n
    • I\/V and C\/V measurements<\/li>\n
    • Measurement of photodiode response with fiber optics<\/li>\n
    • Characterization of the Curie point for ferroelectric materials<\/li>\n
    • Four point probe measurements rve<\/li>\n<\/ul>\n

      Characteristics<\/h3>\n
        \n
      • DC and RF measurements (Hewlett Packard 4145A Semiconductor Parameter Analyzer, Keithley 2400 Series SourceMeters)<\/li>\n
      • Temperature: -65 \u00b0C to 200 \u00b0C<\/li>\n
      • Available Gas: N2<\/sub><\/li>\n
      • CCD camera<\/li>\n
      • Four point probe measurements of resistivity<\/li>\n<\/ul>\n","protected":false},"excerpt":{"rendered":"

        Additional information MANUFACTURER Cascades MODEL Summit 12000 Samples Sample sizes\u00a0: 200 mm maximum Applications I\/V and C\/V measurements Measurement of photodiode response with fiber optics Characterization of the Curie point for ferroelectric materials Four point probe measurements rve Characteristics DC and RF measurements (Hewlett Packard 4145A Semiconductor Parameter Analyzer, Keithley 2400 Series SourceMeters) Temperature: -65 […]<\/p>\n","protected":false},"featured_media":979,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_et_pb_use_builder":"","_et_pb_old_content":"","_et_gb_content_width":""},"product_cat":[358,363],"product_tag":[611],"yoast_head":"\nI\/V and C\/V Measurement (Summit 12000) | IRDQ<\/title>\n<meta name=\"robots\" content=\"noindex, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta 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