{"id":1017,"date":"2021-02-23T11:08:11","date_gmt":"2021-02-23T16:08:11","guid":{"rendered":"https:\/\/demo.irdq.ca\/produit\/x-ray-photoelectron-spectroscopy-xps-axis-ultra\/"},"modified":"2021-04-13T16:06:56","modified_gmt":"2021-04-13T20:06:56","slug":"x-ray-photoelectron-spectroscopy-xps-axis-ultra","status":"publish","type":"product","link":"https:\/\/demo.irdq.ca\/en\/equipements\/x-ray-photoelectron-spectroscopy-xps-axis-ultra\/","title":{"rendered":"X-ray Photoelectron Spectroscopy (xps) (Axis-Ultra)"},"content":{"rendered":"

Additional information<\/h2>\n\n\n\n\n
MANUFACTURER<\/th>\nKratos Analytical<\/td>\n<\/tr>\n
MODEL<\/th>\nAxis-Ultra<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n

Analysis<\/h3>\n
    \n
  • Multifunction apparatus equipped with an ultra-high vacuum system<\/li>\n
  • Bi-dimensional characterization of heterogeneous surfaces via energy-resolved parallel XPS imaging<\/li>\n
  • Surface analysis coupling 3 characterization techniques: X-ray Photoelectron Spectroscopy (XPS); Ion Scattering Spectroscopy (ISS); Auger Scanning Microscopy (ASM)<\/li>\n<\/ul>\n

    Characteristics<\/h3>\n
      \n
    • Double Source Mg-Al<\/li>\n
    • Monochromatic Al Source Al<\/li>\n
    • Large radius hemispherical analyzer<\/li>\n
    • 8 channel detection<\/li>\n
    • Resolution is 0.48 eV on Silver<\/li>\n
    • Integrated high temperature and high pressure reactor<\/li>\n<\/ul>\n

       <\/p>\n

      MODES<\/h3>\n

      ISS<\/h4>\n
        \n
      • Model : ISS Kratos-Ultra<\/li>\n
      • Resolution : 1.2% with He 1000 eV (Au)<\/li>\n<\/ul>\n

        ASM<\/h4>\n
          \n
        • Model : AES Kratos-Ultra<\/li>\n
        • Canon 10 keV LAB6<\/li>\n
        • Spatial resolution : 0.1 \u00b5m<\/li>\n
        • S\/N : from 500 to 500 kcps on Cu-KLL<\/li>\n<\/ul>\n","protected":false},"excerpt":{"rendered":"

          Additional information MANUFACTURER Kratos Analytical MODEL Axis-Ultra Analysis Multifunction apparatus equipped with an ultra-high vacuum system Bi-dimensional characterization of heterogeneous surfaces via energy-resolved parallel XPS imaging Surface analysis coupling 3 characterization techniques: X-ray Photoelectron Spectroscopy (XPS); Ion Scattering Spectroscopy (ISS); Auger Scanning Microscopy (ASM) Characteristics Double Source Mg-Al Monochromatic Al Source Al Large radius hemispherical […]<\/p>\n","protected":false},"featured_media":979,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_et_pb_use_builder":"","_et_pb_old_content":"","_et_gb_content_width":""},"product_cat":[358,361],"product_tag":[636],"yoast_head":"\nX-ray Photoelectron Spectroscopy (xps) (Axis-Ultra) | IRDQ<\/title>\n<meta name=\"robots\" content=\"noindex, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"X-ray Photoelectron Spectroscopy (xps) (Axis-Ultra) | IRDQ\" \/>\n<meta property=\"og:description\" content=\"Additional information MANUFACTURER Kratos Analytical MODEL Axis-Ultra Analysis Multifunction apparatus equipped with an ultra-high vacuum system Bi-dimensional characterization of heterogeneous surfaces via energy-resolved parallel XPS imaging Surface analysis coupling 3 characterization techniques: X-ray Photoelectron Spectroscopy (XPS); Ion Scattering Spectroscopy (ISS); Auger Scanning Microscopy (ASM) Characteristics Double Source Mg-Al Monochromatic Al Source Al Large radius hemispherical […]\" \/>\n<meta property=\"og:url\" content=\"https:\/\/demo.irdq.ca\/equipements\/spectroscopie-de-photoelectrons-x-xps-axis-ultra\/\" \/>\n<meta property=\"og:site_name\" content=\"IRDQ\" \/>\n<meta property=\"article:modified_time\" content=\"2021-04-13T20:06:56+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/demo.irdq.ca\/wp-content\/uploads\/2021\/02\/icons-irdq-bg-1.jpg\" \/>\n\t<meta property=\"og:image:width\" content=\"600\" \/>\n\t<meta property=\"og:image:height\" content=\"600\" \/>\n\t<meta property=\"og:image:type\" content=\"image\/jpeg\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\/\/schema.org\",\"@graph\":[{\"@type\":\"WebPage\",\"@id\":\"https:\/\/demo.irdq.ca\/equipements\/spectroscopie-de-photoelectrons-x-xps-axis-ultra\/\",\"url\":\"https:\/\/demo.irdq.ca\/equipements\/spectroscopie-de-photoelectrons-x-xps-axis-ultra\/\",\"name\":\"X-ray Photoelectron Spectroscopy (xps) (Axis-Ultra) | IRDQ\",\"isPartOf\":{\"@id\":\"https:\/\/demo.irdq.ca\/#website\"},\"primaryImageOfPage\":{\"@id\":\"https:\/\/demo.irdq.ca\/equipements\/spectroscopie-de-photoelectrons-x-xps-axis-ultra\/#primaryimage\"},\"image\":{\"@id\":\"https:\/\/demo.irdq.ca\/equipements\/spectroscopie-de-photoelectrons-x-xps-axis-ultra\/#primaryimage\"},\"thumbnailUrl\":\"https:\/\/demo.irdq.ca\/wp-content\/uploads\/2021\/02\/icons-irdq-bg-1.jpg\",\"datePublished\":\"2021-02-23T16:08:11+00:00\",\"dateModified\":\"2021-04-13T20:06:56+00:00\",\"breadcrumb\":{\"@id\":\"https:\/\/demo.irdq.ca\/equipements\/spectroscopie-de-photoelectrons-x-xps-axis-ultra\/#breadcrumb\"},\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\/\/demo.irdq.ca\/equipements\/spectroscopie-de-photoelectrons-x-xps-axis-ultra\/\"]}]},{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\/\/demo.irdq.ca\/equipements\/spectroscopie-de-photoelectrons-x-xps-axis-ultra\/#primaryimage\",\"url\":\"https:\/\/demo.irdq.ca\/wp-content\/uploads\/2021\/02\/icons-irdq-bg-1.jpg\",\"contentUrl\":\"https:\/\/demo.irdq.ca\/wp-content\/uploads\/2021\/02\/icons-irdq-bg-1.jpg\",\"width\":600,\"height\":600},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\/\/demo.irdq.ca\/equipements\/spectroscopie-de-photoelectrons-x-xps-axis-ultra\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Accueil\",\"item\":\"https:\/\/demo.irdq.ca\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"Equipment and processes available\",\"item\":\"https:\/\/demo.irdq.ca\/equipements\/\"},{\"@type\":\"ListItem\",\"position\":3,\"name\":\"X-ray Photoelectron Spectroscopy (xps) (Axis-Ultra)\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\/\/demo.irdq.ca\/#website\",\"url\":\"https:\/\/demo.irdq.ca\/\",\"name\":\"IRDQ\",\"description\":\"Infrastructure en recherche et d\u00e9veloppement du Qu\u00e9bec\",\"publisher\":{\"@id\":\"https:\/\/demo.irdq.ca\/#organization\"},\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\/\/demo.irdq.ca\/?s={search_term_string}\"},\"query-input\":{\"@type\":\"PropertyValueSpecification\",\"valueRequired\":true,\"valueName\":\"search_term_string\"}}],\"inLanguage\":\"en-US\"},{\"@type\":\"Organization\",\"@id\":\"https:\/\/demo.irdq.ca\/#organization\",\"name\":\"IRDQ\",\"url\":\"https:\/\/demo.irdq.ca\/\",\"logo\":{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\/\/demo.irdq.ca\/#\/schema\/logo\/image\/\",\"url\":\"https:\/\/demo.irdq.ca\/wp-content\/uploads\/2021\/02\/irdq-logo-vertical.png\",\"contentUrl\":\"https:\/\/demo.irdq.ca\/wp-content\/uploads\/2021\/02\/irdq-logo-vertical.png\",\"width\":1705,\"height\":683,\"caption\":\"IRDQ\"},\"image\":{\"@id\":\"https:\/\/demo.irdq.ca\/#\/schema\/logo\/image\/\"}}]}<\/script>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"X-ray Photoelectron Spectroscopy (xps) (Axis-Ultra) | IRDQ","robots":{"index":"noindex","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"og_locale":"en_US","og_type":"article","og_title":"X-ray Photoelectron Spectroscopy (xps) (Axis-Ultra) | IRDQ","og_description":"Additional information MANUFACTURER Kratos Analytical MODEL Axis-Ultra Analysis Multifunction apparatus equipped with an ultra-high vacuum system Bi-dimensional characterization of heterogeneous surfaces via energy-resolved parallel XPS imaging Surface analysis coupling 3 characterization techniques: X-ray Photoelectron Spectroscopy (XPS); 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