{"id":1012,"date":"2021-02-23T11:08:12","date_gmt":"2021-02-23T16:08:12","guid":{"rendered":"https:\/\/demo.irdq.ca\/produit\/x-ray-diffractometer-xrd-x-pert-pro-mrd\/"},"modified":"2021-04-13T16:06:56","modified_gmt":"2021-04-13T20:06:56","slug":"x-ray-diffractometer-xrd-x-pert-pro-mrd","status":"publish","type":"product","link":"https:\/\/demo.irdq.ca\/en\/equipements\/x-ray-diffractometer-xrd-x-pert-pro-mrd\/","title":{"rendered":"X-Ray Diffractometer (xrd) (X-Pert PRO MRD)"},"content":{"rendered":"

Additional information<\/h2>\n\n\n\n\n
MANUFACTURER<\/th>\nPanalytical<\/td>\n<\/tr>\n
MODEL<\/th>\nX-Pert PRO MRD<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n

Samples<\/h3>\n
    \n
  • Types : powder, thin film, ceramics…<\/li>\n
  • Sample size: 100 mm (4 in.) maximum<\/li>\n
  • Thickness: 5 mm<\/li>\n<\/ul>\n

    Applications<\/h3>\n
      \n
    • Semi-quantitative or quantitative analysis<\/li>\n
    • Measurement of epitaxial layers quality (Bragg-Brentano, grazing incidence, phi-scan, rocking curve, polar figure, Reciprocal space mapping, in-plane diffraction)<\/li>\n
    • Reflectivity to determine the density and thickness of single or multiple thin films<\/li>\n<\/ul>\n

      Characteristics<\/h3>\n
        \n
      • X-ray source : CuK\u03b1, l = 1.542 \u00c5<\/li>\n
      • Parralel and divergent beams<\/li>\n
      • Horizontal measurement configuration<\/li>\n
      • Detector : proportional, gas based<\/li>\n
      • 4 circle platform:\n
          \n
        • 2\u03b8 = -10\u00b0 \u00e0 150\u00b0<\/li>\n
        • \u03a9 = -90\u00b0 \u00e0 +90\u00b0<\/li>\n
        • \u03a6 = 0\u00b0 \u00e0 360\u00b0<\/li>\n
        • \u03a8 = -90\u00b0 \u00e0 +90\u00b0<\/li>\n
        • X and Y : 100 mm displacement<\/li>\n
        • Z : 11 mm displacement<\/li>\n<\/ul>\n<\/li>\n
        • Rocking Curve and Parallel Plate modules, Collimator 0.18\u00b0 (PPC)<\/li>\n<\/ul>\n","protected":false},"excerpt":{"rendered":"

          Additional information MANUFACTURER Panalytical MODEL X-Pert PRO MRD Samples Types : powder, thin film, ceramics… Sample size: 100 mm (4 in.) maximum Thickness: 5 mm Applications Semi-quantitative or quantitative analysis Measurement of epitaxial layers quality (Bragg-Brentano, grazing incidence, phi-scan, rocking curve, polar figure, Reciprocal space mapping, in-plane diffraction) Reflectivity to determine the density and thickness […]<\/p>\n","protected":false},"featured_media":979,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_et_pb_use_builder":"","_et_pb_old_content":"","_et_gb_content_width":""},"product_cat":[358,361],"product_tag":[581],"yoast_head":"\nX-Ray Diffractometer (xrd) (X-Pert PRO MRD) | IRDQ<\/title>\n<meta name=\"robots\" content=\"noindex, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta 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