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Home / Equipment and processes available / Characterization / Thin film thickness measurements

Thin film thickness measurements

Showing all 9 results

  • Ellipsometer (IR-VASE)

    IR-VASE $0.00
  • Ellipsometer (M-2000)

    M-2000 $0.00
  • Ellipsometer (RC2)

    RC2 $0.00
  • Ellipsometer (VVASE)

    VVASE $0.00
  • Ellipsometer (UVISEL-NIR)

    UVISEL-NIR $0.00
  • Profilometer (NR-9200HR)

    NR-9200HR $0.00
  • Profilometer (Dektak IIA)

    Dektak IIA $0.00
  • Profilometer (Dektak D150)

    Dektak D150 $0.00
  • Profilometry (XP-2)

    XP-2 $0.00

IRDQ is your one-stop-shop to access to Quebec’s R&D infrastructure. Our objective is to facilitate access to over $400 M in equipment and expertise for your company’s R&D activities.

 

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Your IRDQ contact:

SÉBASTIEN GARBARINO
sebastien.garbarino@irdq.ca
(514) 284-0211 ext 226

 

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