Characterization
Showing 64–70 of 70 results
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Atomic Force Microscopy (afm) (Nanoscope IIIa)
Nanoscope IIIa $0.00 -
Scanning electron microscope – focused ion beam (SEM-FIB)
Lyra3 $0.00 -
Scanning Electron Microscope (sem) (Quanta 3D FEG)
Quanta 3D FEG $0.00 -
Scanning Electron Microscope (sem) (JSM 7401F)
JSM 7401F $0.00 -
Scanning Electron Microscope (sem) (JSM 6300F)
JSM 6300F $0.00 -
Scanning Electron Microscope (sem) (JSM 7600 TFE)
JSM 7600 TFE $0.00 -
Transmission Electron Microscope (tem)
JSM 2100-F $0.00