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Characterization 138

Physico-chemical characterization 6Spectrometric and spectroscopic analysis 20Thermal characterization 3Electrical characterization 3Electrochemical characterization 6Microscopy 20Sample preparation for electron microscopy 1Thin film thickness measurements 9

Scale-up 22

Pilot test bench 8Backend/frontend process 3

Cleanroom 60

Other lithographic techniques 7Thin film and micro/nanoparticule growth 4Etcher 3Optical and ebeam lithography 7Backend/frontend process 3Thermal process 6

Materials synthesis and surface functionalization 24

Thin film and micro/nanoparticule growth 9Backend/frontend process 1Electrochemical surface structuring 1Organic material synthesis 1

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NoneAtomic force microscopy (AFM) 10Auger spectroscopy 2BET porosity measurement 1Bioreactor 8Centrifugal deposits 4Charge and diameter measurement (zeta potential) 3Chemical composition 1Cyclic voltametry 4Differential scanning calorimetry (DSC) 2Dip-pen nanolithography 1Ebeam deposition 1Ebeam lithography 2Ellipsometry 5Focused ion beam (FIB) 1Fourier transform infrared spectroscopy (FT-IR) 5Furnace annealling 3Glove box 1I/V, C/V and four point probe 3Impedance measurement 1Inductively coupled plasma reactive ion etching (ICP-RIE) 3Ion implant 2Joule effect evaporator 2Laser ablation deposition 2Liquid phase chromatography 2Low–pressure chemical vapor deposition - LPCVD 1Mask aligner 5Microfabrication 4Nuclear magnetic resonance (NMR) 2Plasma enhanced chemical vapor deposition - PECVD 1Polishing 2Potentiostat 1Preparation of thin slices of samples 1Printers - printable electronic 2Profilometry 4Quartz cristal microbalance 1Raman spectroscopy 3Rapid thermal anneal (RTA) 3RBS spectroscopy 1Scanning electron microscopy (SEM) 5Scanning tunneling microscope / atomic force microscopy (STM/AFM) 4Sputtering deposition 1Surface analysis (TOF-SIMS) 1Thermogravimetry (TGA) 1Transmission electron microscopy (TEM) 1Wafer saw 1Wire bonding 1X-Ray photoelectron spectroscopy (XPS) 4Xray diffraction (XRD) 3

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Catégories mobile

Characterization 138

Scale-up 22

Pilot test bench 8Backend/frontend process 3

Cleanroom 60

Other lithographic techniques 7Thin film and micro/nanoparticule growth 4Etcher 3Optical and ebeam lithography 7Backend/frontend process 3Thermal process 6

Materials synthesis and surface functionalization 24

Thin film and micro/nanoparticule growth 9Backend/frontend process 1Electrochemical surface structuring 1Organic material synthesis 1

Search Products

Tag

NoneAtomic force microscopy (AFM)Auger spectroscopyBET porosity measurementBioreactorCentrifugal depositsCharge and diameter measurement (zeta potential)Chemical compositionCyclic voltametryDifferential scanning calorimetry (DSC)Dip-pen nanolithographyEbeam depositionEbeam lithographyEllipsometryFocused ion beam (FIB)Fourier transform infrared spectroscopy (FT-IR)Furnace anneallingGlove boxI/V, C/V and four point probeImpedance measurementInductively coupled plasma reactive ion etching (ICP-RIE)Ion implantJoule effect evaporatorLaser ablation depositionLiquid phase chromatographyLow–pressure chemical vapor deposition - LPCVDMask alignerMicrofabricationNuclear magnetic resonance (NMR)Plasma enhanced chemical vapor deposition - PECVDPolishingPotentiostatPreparation of thin slices of samplesPrinters - printable electronicProfilometryQuartz cristal microbalanceRaman spectroscopyRapid thermal anneal (RTA)RBS spectroscopyScanning electron microscopy (SEM)Scanning tunneling microscope / atomic force microscopy (STM/AFM)Sputtering depositionSurface analysis (TOF-SIMS)Thermogravimetry (TGA)Transmission electron microscopy (TEM)Wafer sawWire bondingX-Ray photoelectron spectroscopy (XPS)Xray diffraction (XRD)

X-ray Photoelectron Spectroscopy (xps) (Escalab 220i XL)
Escalab 220i XL $0.00
Atomic Force Microscopy (afm) (Multimode)
Multimode $0.00
Furnace Annealing (GSL-1300-40X)
GSL-1300-40X $0.00
Printed Electronics System
F-Serie $0.00
Polissage (CP3000)
CP3000 $0.00
Wire Bonding
KS4523 $0.00
Wafer Saw (ADT 7100 Provectus)
ADT 7100 Provectus $0.00
Atomic Force Microscopy (afm) (Nscriptor)
Nscriptor $0.00
Atomic Force Microscopy (afm) (4500 UHV AFM/STM)
4500 UHV AFM/STM $0.00
Polishing (1PM52-1)
1PM52-1 $0.00
Focused Ion Beam (fib)
FB 2000-A $0.00
Transmission Electron Microscope (tem)
JSM 2100-F $0.00
Wafer Saw (DAD3350)
DAD3350 $0.00
Bet Porosimetry (Autosorb-1)
Autosorb-1 $0.00
Particle sizing (Zeta Sizer)
Zetasizer Nano S90 $0.00
X-Ray Diffractometer (xrd) (D8 Advance)
D8 Advance $0.00
Liquid Phase Chromatography (LC 1200 Series / 6410 Triple Quadrupole LCMS)
LC 1200 Series / 6410 Triple Quadrupole LCMS $0.00
200 liters reactor
N/A $0.00
Scanning Electron Microscope (sem) (JSM 7401F)
JSM 7401F $0.00
Laser Photolithography
DWL-66FS $0.00
Raman Spectroscopy (Invia)
Invia $0.00
Dip-pen Nanolithography
Nscriptor $0.00
Plasma Enhanced Chemical Vapor Deposition (PECVD)
PlasmaLab System 100 - Modular PH2 $0.00
Raman Spectroscopy (RM)
RM $0.00
Atomic Force Microscopy (afm) (Enviroscope)
Enviroscope $0.00
Liquid Phase Chromatography (LC 1200 Series / 6210 TOF LCMS )
LC 1200 Series / 6210 TOF LCMS $0.00
Quartz Crystal Microbalance
QCA922 $0.00
30 Liters Reactor
N/A $0.00
Rapid Thermal Annealing (rta) (Heatpulse 410)
Heatpulse 410 $0.00
400 liters reactor
N/A $0.00
Auger Spectroscopy (JAMP-30 Auger Microprobe)
JAMP-30 Auger Microprobe $0.00
X-ray Photoelectron Spectroscopy (xps)(PHI 5600-ci spectrometer)
PHI 5600-ci spectrometer $0.00
Scanning Electron Microscope (sem) (JSM 6300F)
JSM 6300F $0.00
Atomic Force Microscopy (afm) (XE-150)
XE-150 $0.00
Atomic Force Microscopy (afm) (Multimode)
Multimode $0.00
Mesure de Charge et de Diamètre (Zeta analyzer) (ZetaPlus 90Plus/BI-MAS)(ZetaPlus 90Plus/BI-MAS)
ZetaPlus 90Plus/BI-MAS $0.00
Raman Spectroscopy (LabRAM 800)
LabRAM 800 $0.00
Spin Coater (CEE100)
CEE100 $0.00
Inductively coupled plasma reactive ion etcher (icp-rie) Cryogenic process
PlasmaLab System 100 - Modular ICP380 $0.00
Spin Coater (SpinBall)
SpinBall $0.00
X-ray Photoelectron Spectroscopy (xps) (Axis-Ultra)
Axis-Ultra $0.00
Aligner (MJB3)
MJB3 $0.00
Atomic Force Microscopy (afm) (Dimensions 3100)
Dimensions 3100 $0.00
Scanning electron microscope – focused ion beam (SEM-FIB)
Lyra3 $0.00
Potentiostat for Electrochemical Nanostructuring
N/A $0.00
Thermogravimetry (tga)
SDTA 851 $0.00
ebeam Lithography
Vistec VB6 UHR EWF $0.00
Cyclic Voltammetry (VMP3)
VMP3 $0.00
20 liters reactor
N/A $0.00
Furnace Annealing (Four 3 zones 5566)
Four 3 zones 5566 $0.00
Electron Beam Deposition
AXXIS $0.00
Elastic Recoil Detection (erd)
Accélérateur Tandem 6 MV $0.00
Ellipsometer (M-2000)
M-2000 $0.00
Aligner (MA4)
MA4 $0.00
Aligner (EVG 620)
EVG 620 $0.00
Joule Effect Evaporator
Home made $0.00
Fourier Transform Infrared Spectroscopy (ftir) (MB-Series A and MB-Series F)
MB-Series A and MB-Series F $0.00
Low Pressure Chemical Vapor Deposition (lpcvd)
Tystar $0.00
Profilometer (NR-9200HR)
NR-9200HR $0.00
Sputtering
CMS-18 $0.00
Aligner (200)
200 $0.00
Nuclear Magnetic Resonance Spectrometer (nmr) (Inova 600)
Inova 600 $0.00
Cyclic Voltammetry (1470)
1470 $0.00
Ion Implantation (IMC-200)
IMC-200 $0.00
800 liters reactor
N/A $0.00
Ellipsometer (UVISEL-NIR)
UVISEL-NIR $0.00
Aligner (200)
200 $0.00
Atomic Force Microscopy (afm) (Nanoscope IIIa)
Nanoscope IIIa $0.00
Spin Coater (WS-400)
WS-400 $0.00
Laser Ablation Deposition
3000 $0.00
Ion Implantation (N/A)
N/A $0.00
Impedance Analyzer
1255B (2 machines) $0.00
X-ray Photoelectron Spectroscopy (xps) (Escalab MkII)
Escalab MkII $0.00
Inductively coupled plasma reactive ion etcher (icp-drie) Bosch and Cryogenic Processes
PlasmaLab System 100 – Modular ICP180 $0.00
Profilometer (Dektak IIA)
Dektak IIA $0.00
Auger Spectroscopy (NanoSAM)
NanoSAM $0.00
Cyclic Voltammetry (VMP3)
VMP3 $0.00
Cyclic Voltammetry (1470)
1470 $0.00
Fourier Transform Infrared Spectroscopy (ftir) (Nicolet 6700 / NXR FT-Raman Module)
Nicolet 6700 / NXR FT-Raman Module $0.00
Scanning Electron Microscope (sem) (JSM 7600 TFE)
JSM 7600 TFE $0.00
Charge and Diameter Measurement (Zeta Analyzer) (Zetasizer Nano Zs)
Zetasizer Nano Zs $0.00
Profilometry (XP-2)
XP-2 $0.00
Rapid Thermal Annealing (AW410)
AW410 $0.00
Time of Flight Secondary Ion Mass Spectrometer (tof-sims)
NR-9200HR $0.00
Differential Scanning Calorimeter (dsc) (823)
823 $0.00
Magnetron Sputtering
N/A $0.00
Ellipsometer (RC2)
RC2 $0.00
Laser Ablation Deposition
IPEX $0.00
Atomic Force Microscopy (afm) (VT UHV STM/AFM)
VT UHV STM/AFM $0.00
Ultramicrotome
MT-7 $0.00
Fourier Transform Infrared Spectroscopy (ftir) (FTS6000)
FTS6000 $0.00
Ellipsometer (VVASE)
VVASE $0.00
I/V and C/V Measurement (Summit 12000)
Summit 12000 $0.00
Joule Effect Evaporator
Home made $0.00
X-Ray Diffractometer (xrd) (X’Pert)
X’Pert $0.00
This the name of the product
asdasdasd $0.00
Atomic Force Microscopy (afm) (AFM/STM Multimode)
AFM/STM Multimode $0.00
I/V and C/V Measurement (Alessi 4500)
Alessi 4500 $0.00
X-Ray Diffractometer (xrd) (X-Pert PRO MRD)
X-Pert PRO MRD $0.00
15 Liters Reactor
N/A $0.00
Nuclear Magnetic Resonance Spectrometer (nmr) (Inova 400)
Inova 400 $0.00
Fourier Transform Infrared Spectroscopy (ftir) (Magna-550, Magna-760, Magna-850)
Magna-550, Magna-760, Magna-850 $0.00
Rapid Thermal Annealing (rta) (Heatpulse AG610)
Heatpulse AG610 $0.00
Atomic Force Microscopy (afm) (Dimension TM 3100)
Dimension TM 3100 $0.00
Printer
Dimatix Materials Printer DMP-2800 $0.00
Atomic Force Microscopy (AFM) (Multimode 8)
Multimode 8 $0.00
Rutherford Backscattering Spectroscopy (rbs)
Accelerator Tandetron 1.7 MV and Tandem 6 MV $0.00
Scanning Electron Microscope (sem) (Quanta 3D FEG)
Quanta 3D FEG $0.00
Fourier Transform Infrared Spectroscopy (ftir) (FTS7000-UMA600)
FTS7000-UMA600 $0.00
Atomic Force Microscope (afm) (CPII)
CPII $0.00
Ellipsometer (IR-VASE)
IR-VASE $0.00
Inductively coupled plasma reactive ion etcher (icp-rie)
PlasmaLab System 100 - Modular ICP380 $0.00
Four Point Probe Mesurement
S-302 $0.00
120 liters reactor
N/A $0.00
Parylene Deposition
PDS 2010 LabCoater 2 $0.00
Bonder
SB6E $0.00
Glove box
N/A $0.00
Differential Scanning Calorimeter (dsc) (DSC-1)
DSC-1 $0.00
Profilometer (Dektak D150)
Dektak D150 $0.00
Ebeam evaporator
Home made $0.00
Furnace Annealing (Thermo Scientific)
Thermo Scientific $0.00
5 Liters Reactor
N/A $0.00
Atomic Force Microscopy (afm) (NanoMan VS)
NanoMan VS $0.00

Equipment and processes available

X-ray Photoelectron Spectroscopy (xps) (Escalab 220i XL)

Atomic Force Microscopy (afm) (Multimode)

Furnace Annealing (GSL-1300-40X)

Printed Electronics System

Polissage (CP3000)

Wire Bonding

Wafer Saw (ADT 7100 Provectus)

Atomic Force Microscopy (afm) (Nscriptor)

Atomic Force Microscopy (afm) (4500 UHV AFM/STM)

Polishing (1PM52-1)

Focused Ion Beam (fib)

Transmission Electron Microscope (tem)

Wafer Saw (DAD3350)

Bet Porosimetry (Autosorb-1)

Particle sizing (Zeta Sizer)

X-Ray Diffractometer (xrd) (D8 Advance)

Liquid Phase Chromatography (LC 1200 Series / 6410 Triple Quadrupole LCMS)

200 liters reactor

Scanning Electron Microscope (sem) (JSM 7401F)

Laser Photolithography

Raman Spectroscopy (Invia)

Dip-pen Nanolithography

Plasma Enhanced Chemical Vapor Deposition (PECVD)

Raman Spectroscopy (RM)

Atomic Force Microscopy (afm) (Enviroscope)

Liquid Phase Chromatography (LC 1200 Series / 6210 TOF LCMS )

Quartz Crystal Microbalance

30 Liters Reactor

Rapid Thermal Annealing (rta) (Heatpulse 410)

400 liters reactor

Auger Spectroscopy (JAMP-30 Auger Microprobe)

X-ray Photoelectron Spectroscopy (xps)(PHI 5600-ci spectrometer)

Scanning Electron Microscope (sem) (JSM 6300F)

Atomic Force Microscopy (afm) (XE-150)

Atomic Force Microscopy (afm) (Multimode)

Mesure de Charge et de Diamètre (Zeta analyzer) (ZetaPlus 90Plus/BI-MAS)(ZetaPlus 90Plus/BI-MAS)

Raman Spectroscopy (LabRAM 800)

Spin Coater (CEE100)

Inductively coupled plasma reactive ion etcher (icp-rie) Cryogenic process

Spin Coater (SpinBall)

X-ray Photoelectron Spectroscopy (xps) (Axis-Ultra)

Aligner (MJB3)

Atomic Force Microscopy (afm) (Dimensions 3100)

Scanning electron microscope – focused ion beam (SEM-FIB)

Potentiostat for Electrochemical Nanostructuring

Thermogravimetry (tga)

ebeam Lithography

Cyclic Voltammetry (VMP3)

20 liters reactor

Furnace Annealing (Four 3 zones 5566)

Electron Beam Deposition

Elastic Recoil Detection (erd)

Ellipsometer (M-2000)

Aligner (MA4)

Aligner (EVG 620)

Joule Effect Evaporator

Fourier Transform Infrared Spectroscopy (ftir) (MB-Series A and MB-Series F)

Low Pressure Chemical Vapor Deposition (lpcvd)

Profilometer (NR-9200HR)

Sputtering

Aligner (200)

Nuclear Magnetic Resonance Spectrometer (nmr) (Inova 600)

Cyclic Voltammetry (1470)

Ion Implantation (IMC-200)

800 liters reactor

Ellipsometer (UVISEL-NIR)

Aligner (200)

Atomic Force Microscopy (afm) (Nanoscope IIIa)

Spin Coater (WS-400)

Laser Ablation Deposition

Ion Implantation (N/A)

Impedance Analyzer

X-ray Photoelectron Spectroscopy (xps) (Escalab MkII)

Inductively coupled plasma reactive ion etcher (icp-drie) Bosch and Cryogenic Processes

Profilometer (Dektak IIA)

Auger Spectroscopy (NanoSAM)

Cyclic Voltammetry (VMP3)

Cyclic Voltammetry (1470)

Fourier Transform Infrared Spectroscopy (ftir) (Nicolet 6700 / NXR FT-Raman Module)