Time of Flight Secondary Ion Mass Spectrometer (tof-sims)
Time of Flight Secondary Ion Mass Spectrometer (tof-sims)
Additional information
| MANUFACTURER | ION-TOF Gmbh |
|---|---|
| MODEL | NR-9200HR |
Intrument unique in Quebec :
- Allowing analysis with high mass resolution ( 0.0001 amu) and a high sensitivity of the order of the ppb
- Semi-quantitative surface analysis: spectroscopy, imaging and depth profiling
- Measurement depth: from 2-3 monolayers to 1-2 micrometers
- Mapping available
- Lateral resolution: 150 nm
Applications
- Analysis of solid surface chemistry, including fragile elements such as proteins
To use this equipment
The equipment available is accessible to the academic and industrial research community.
To learn about the terms of use and availability, please complete the form below. After reviewing your request, we will get in touch with you promptly to offer the best available solution.