Scanning Electron Microscope (sem) (JSM 7600 TFE)
Scanning Electron Microscope (sem) (JSM 7600 TFE)
Additional information
| MANUFACTURER | JEOL |
|---|---|
| MODEL | JSM 7600 TFE |
Samples
- Equipped with a Field Effect Gun (FEG) for the observation of non-conducting samples
Analysis
- High resolution surface imaging
- Lateral resolution : 1.4 nm at 1 kV and 1.0 nm at 15 kV
Characteristics
- Instrument unique in Canada allowing the analysis of non-conducting samples at high resolution
Variants
Detection of back-scatted electrons for phase analysis
- Lateral resolution : 3 nm at 1 kV
- Sample holder for non-conducting samples
Energy Dispersive Spectrometry (EDS) for chemical composition determination
- Semi-quantitative and quantitative (with standards)
- Mapping possible
- Lateral resolution : of the order of one micrometer (depending on the material and the accelerating voltage)
- Applications : Elemental mapping, quantification of the chemical composition of a given phase
- Detection limit: about 0.1% atomic
Wavelength Dispersive Spectrometry (WDS) for chemical composition determination
- Semi-quantitative and quantitative (with standards)
- Mapping possible
- Lateral resolution : of the order of one micrometer (depending on the material and the accelerating voltage)
- Applications : Elemental mapping, quantification of the chemical composition of a given phase
- Detection limit: about 0.1% atomic
To use this equipment
The equipment available is accessible to the academic and industrial research community.
To learn about the terms of use and availability, please complete the form below. After reviewing your request, we will get in touch with you promptly to offer the best available solution.