Scanning Electron Microscope (sem) (JSM 7401F)
Scanning Electron Microscope (sem) (JSM 7401F)
Additional information
| MANUFACTURER | JEOL |
|---|---|
| MODEL | JSM 7401F |
Samples
- Sample size: 150 mm maximum
- Thickness: 5 mm maximum
Analysis
- Acceleration: 0.1 keV to 30 keV
- Resolution : about 1 nm
Variants
- Phase analysis by backscattered electron detection
- Energy Dispersive Spectrometer (EDS) for X-ray elemental analysis
To use this equipment
The equipment available is accessible to the academic and industrial research community.
To learn about the terms of use and availability, please complete the form below. After reviewing your request, we will get in touch with you promptly to offer the best available solution.