Profilometer (Dektak IIA)
Profilometer (Dektak IIA)
Additional information
| MANUFACTURER | Sloan |
|---|---|
| MODEL | Dektak IIA |
Analysis
- Vertical resolution: 0.6 nm
- Scan length: 30 mm
- Horizontal resolution: 50 nm
Related products
To use this equipment
The equipment available is accessible to the academic and industrial research community.
To learn about the terms of use and availability, please complete the form below. After reviewing your request, we will get in touch with you promptly to offer the best available solution.