Magnetron Sputtering

Additional information

MANUFACTURER N/A
MODEL N/A

Samples

  • Sample size : 1 mm to 100 mm (4 in.)
  • Wafer uniformity : 13% on 100 mm (4 in.

Characteristics

  • Pressure  : up to 1×10-6 Torr
  • Pass through for sample transfer
  • Target types : 50 mm (2 in.) diameter, 99.9% purity
  • Substrate types allowed: semiconductors, metal and plastics
  • Gas: Ar, N2, O2
  • Deposition rate: 1 to 10 Å/s

 

ROUTINE PROCESS

Silicon Deposition

  • Thickness: from 10 nm to 2000 nm

Metal Deposition

  • Type: Au, Cr, Ni
  • Thickness: from 10 nm to 2000 nm

 

ROUTINE PROCESS

Oxide Deposition

  • Type: ITO, silicon dioxide
  • Thickness: from 10 nm to 20000 nm

Nitride Deposition

  • Type of nitride: silicon nitride
  • Thickness: from 10 nm to 2000 nm

To use this equipment

The equipment available is accessible to the academic and industrial research community.

To learn about the terms of use and availability, please complete the form below. After reviewing your request, we will get in touch with you promptly to offer the best available solution.