I/V and C/V Measurement (Summit 12000)
I/V and C/V Measurement (Summit 12000)
Additional information
| MANUFACTURER | Cascades |
|---|---|
| MODEL | Summit 12000 |
Samples
- Sample sizes : 200 mm maximum
Applications
- I/V and C/V measurements
- Measurement of photodiode response with fiber optics
- Characterization of the Curie point for ferroelectric materials
- Four point probe measurements rve
Characteristics
- DC and RF measurements (Hewlett Packard 4145A Semiconductor Parameter Analyzer, Keithley 2400 Series SourceMeters)
- Temperature: -65 °C to 200 °C
- Available Gas: N2
- CCD camera
- Four point probe measurements of resistivity
To use this equipment
The equipment available is accessible to the academic and industrial research community.
To learn about the terms of use and availability, please complete the form below. After reviewing your request, we will get in touch with you promptly to offer the best available solution.