I/V and C/V Measurement (Alessi 4500)
I/V and C/V Measurement (Alessi 4500)
Additional information
| MANUFACTURER | Alessi |
|---|---|
| MODEL | Alessi 4500 |
Samples
- Sample sizes : 125 mm maximum
- Allows probes positioning within a few tens of micrometers on various samples allowing electrical measurements of micro-circuits.
Applications
- Diode I/V curve
- Transistors mobility curve
Characteristics
- DC electrical measurements
- Measurements may be performed with 8 micro-probes
- Black box for low current measurements
Related products
-
Atomic Force Microscopy (afm) (XE-150)
XE-150 $0.00 -
Atomic Force Microscopy (afm) (Enviroscope)
Enviroscope $0.00 -
Atomic Force Microscopy (afm) (4500 UHV AFM/STM)
4500 UHV AFM/STM $0.00 -
Scanning Electron Microscope (sem) (JSM 7401F)
JSM 7401F $0.00 -
Atomic Force Microscopy (afm) (VT UHV STM/AFM)
VT UHV STM/AFM $0.00
To use this equipment
The equipment available is accessible to the academic and industrial research community.
To learn about the terms of use and availability, please complete the form below. After reviewing your request, we will get in touch with you promptly to offer the best available solution.