Four Point Probe Mesurement
Four Point Probe Mesurement
Additional information
| MANUFACTURER | Lucas Signatone Corp. |
|---|---|
| MODEL | S-302 |
Characteristics
- Quantitative measurement of thin films resistivity
- Measurement of thin films thickness
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To use this equipment
The equipment available is accessible to the academic and industrial research community.
To learn about the terms of use and availability, please complete the form below. After reviewing your request, we will get in touch with you promptly to offer the best available solution.