Focused Ion Beam (fib)
Focused Ion Beam (fib)
Additional information
| MANUFACTURER | Hitachi |
|---|---|
| MODEL | FB 2000-A |
Samples
- Dimensions of the observed areas: maximum 254 mm x 254 mm (10ˮ x 10ˮ)
- Dedicated to the preparation of thin lamella samples for subsequent Transmission Electron Microscope (TEM) analysis
- Types of materials: Metals, Ceramics, Polymers, Composites, etc.
Characteristics
- Equipped with a Tungsten gun for depositions
- Equipped with a micro-handler for removing thin lamella samples
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To use this equipment
The equipment available is accessible to the academic and industrial research community.
To learn about the terms of use and availability, please complete the form below. After reviewing your request, we will get in touch with you promptly to offer the best available solution.