Ellipsometer (IR-VASE)
Ellipsometer (IR-VASE)
Additional information
| MANUFACTURER | J.A. Woollam |
|---|---|
| MODEL | IR-VASE |
Analysis
- Reflexion mode optical analysis with polarized infrared light (quantitative)
- Lateral resolution: 1 cm
- Mapping not possible
Applications
- Measurements of films thickness
- Measurement of refractive index
- Analysis of chemical composition
- Measurement of absorption, interfaces, doping, anisotropy and porosity
Characteritics
- Highly specialized equipment that allows the precise measurement of refractive index in the far infrared region, as well as absorption bands caused by chemical bonds.
- Allows also the determination of doping in semiconductors
- Wavelengths: from 2 µm to 30 µm
- Ellipsometer with variable angle and compensator
- Available modules: controlled environment chamber with heating and cooling
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To use this equipment
The equipment available is accessible to the academic and industrial research community.
To learn about the terms of use and availability, please complete the form below. After reviewing your request, we will get in touch with you promptly to offer the best available solution.