Atomic Force Microscopy (afm) (Nscriptor)
Atomic Force Microscopy (afm) (Nscriptor)
Additional information
| MANUFACTURER | NanoINK |
|---|---|
| MODEL | Nscriptor |
Samples
- Samples sizes: Maximum 50 mm
- Thickness: Maximum 38 mm
Analysis
- Types : contact mode and AC (tapping) mode
- Applications: measurements of the size of particle on a surface, film thickness and surface roughness
Characteristics
- Mapping possible with a precision of 150 nm
- Lateral resolution: 1 nm
- XYZ scanner range: 90 x 90 x 8 µm
- Equipment that allows Dip-Pen Nanolithography
To use this equipment
The equipment available is accessible to the academic and industrial research community.
To learn about the terms of use and availability, please complete the form below. After reviewing your request, we will get in touch with you promptly to offer the best available solution.