Atomic Force Microscopy (afm) (Nanoscope IIIa)
Atomic Force Microscopy (afm) (Nanoscope IIIa)
Additional information
| MANUFACTURER | Veeco |
|---|---|
| MODEL | Nanoscope IIIa |
Analyses
- Modes : contact, tapping
- Scan range: 120 µm (X-Y), 5 µm (Z)
- Depth resolution: 0.01 nm
- Lateral resolution: 0.1 nm
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To use this equipment
The equipment available is accessible to the academic and industrial research community.
To learn about the terms of use and availability, please complete the form below. After reviewing your request, we will get in touch with you promptly to offer the best available solution.