Atomic Force Microscopy (afm) (NanoMan VS)
Atomic Force Microscopy (afm) (NanoMan VS)
Additional information
| MANUFACTURER | Veeco |
|---|---|
| MODEL | NanoMan VS |
Samples
- Samples size : 150 mm maximum
Analysis
- Modes: contact, non-contact, lateral force, phase image, magnetic force, electronic force, surface potential and torsion resonance
- Scanning range: 90 µm (X-Y), 9 µm (Z)
- Number of measurement points per image: 5120 x 5120
- Resolution : 16 bits
- Motorized stage: operating range 120 x 100 mm
Applications
- Analysis of small surface phases
- Nanometric scale validation of photoresist final surfaces
- Surface analysis of hard materials
Characteristics
- Unidirectional resolution: 2 µm
- Scanning speed and range adjustable
- Thickness: 12 mm maximum
- Z noise: less than 0.1 nm RMS
- Limitations: some semi-crystalline materials may be analyzed
- Incompatibility: all soft materials
To use this equipment
The equipment available is accessible to the academic and industrial research community.
To learn about the terms of use and availability, please complete the form below. After reviewing your request, we will get in touch with you promptly to offer the best available solution.