Atomic Force Microscopy (afm) (Dimensions 3100)
Atomic Force Microscopy (afm) (Dimensions 3100)
Additional information
| MANUFACTURER | Digital Instruments |
|---|---|
| MODEL | Dimensions 3100 |
Samples
- Sample size: maximum 101 mm (4”)
- Thickness: maximum 12.7 mm (0.5”)
- Open geometry
Analysis
- Modes: Contact mode, Tapping mode, Lateral Force Microscopy (LFM), Magnetic Force Microscopy (MFM), Scanning Tunnel Microscopy (STM)
- Topographical measurements: quantitative
- Measurement of viscoelastic properties: qualitative
- Mapping possible
- Lateral resolution: 2 nm
Applications
- Measurements of topography in ambient or liquid environments
- Measurements of mechanical properties
- Measurement of friction
- Measurement of roughness
- Measurement of magnetic field gradients
- Measurement of electrical fields gradients
- Measurement of tip/surface interaction force
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To use this equipment
The equipment available is accessible to the academic and industrial research community.
To learn about the terms of use and availability, please complete the form below. After reviewing your request, we will get in touch with you promptly to offer the best available solution.