Atomic Force Microscopy (afm) (Dimension TM 3100)
Atomic Force Microscopy (afm) (Dimension TM 3100)
Additional information
| MANUFACTURER | Digital Instruments |
|---|---|
| MODEL | Dimension TM 3100 |
Analyses
- Modes: contact, tapping, nano-indentation
- Available tips :
- Contact mode : SiN
- Tapping mode : Si, radii 10 nm and 2 nm
- Nano-indentation : Berkovich diamond tip (radius 50 nm)
- Liquid milieu sample analysis
Applications
- Determination of topography, phases, hardness and thickness parameters
Related products
To use this equipment
The equipment available is accessible to the academic and industrial research community.
To learn about the terms of use and availability, please complete the form below. After reviewing your request, we will get in touch with you promptly to offer the best available solution.