Atomic Force Microscope (afm) (CPII)
Atomic Force Microscope (afm) (CPII)
Additional information
| MANUFACTURER | Veeco |
|---|---|
| MODEL | CPII |
Analyses
- Modes : contact, tapping, non-contact
Applications
- Phase imaging, Lateral Force Microscopy, Magnetic Force Microscopy, Electrical Force Microscopy, Liquid milieu imaging
Related products
To use this equipment
The equipment available is accessible to the academic and industrial research community.
To learn about the terms of use and availability, please complete the form below. After reviewing your request, we will get in touch with you promptly to offer the best available solution.