Atomic Force Microscopy (afm) (Multimode)
Atomic Force Microscopy (afm) (Multimode)
Additional information
| MANUFACTURER | Digital Instruments |
|---|---|
| MODEL | Multimode |
Analyses
- Modes : contact, tapping, lateral force (LFM), magnetic force (MFM), tunneling (STM)
- Quantitative topographical measurements
- Qualitative viscoelastic measurements
- Mapping possible
- Lateral resolution: 2 nm
- Vacuum chamber: 10-5 Torr
- Temperature control : ≤185 °C (ambient); ≤ 275 °C (vacuum); ≤ 60 °C (liquid)
- Liquid cell
STM Variant
- Quantitative low current tunnel effect microscopy
- Mapping possible
- Lateral resolution: atomic
- Applications: Ambient imaging of conductive and semi-conductive surfaces with atomic resolution
Applications
- Topographical measurements in air or liquid milieu, measurement of mechanical properties, friction properties, roughness, magnetic gradients, electrical gradients, tip/surface interaction forces
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To use this equipment
The equipment available is accessible to the academic and industrial research community.
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