Atomic Force Microscopy (afm) (Multimode)
Atomic Force Microscopy (afm) (Multimode)
Additional information
| MANUFACTURER | Digital Instruments |
|---|---|
| MODEL | Multimode |
Analyses
- Modes : contact, tapping, lateral force (LFM), magnetic force (MFM), tunneling (STM), atomic force (AFM), electrochemistry
- Quantitative topographical measurements
- Qualitative viscoelastic measurements
- Mapping possible
- Lateral resolution: ≤ 1.5 nm
- Liquid cell
- Electrochemical cell
- High resolution scanner
Applications
- Topographical measurements in air or liquid milieu, measurement of mechanical properties, friction properties, magnetic gradients, electrical gradients, tip/surface interaction forces, electrochemistry
Related products
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Atomic Force Microscopy (afm) (AFM/STM Multimode)
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Transmission Electron Microscope (tem)
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To use this equipment
The equipment available is accessible to the academic and industrial research community.
To learn about the terms of use and availability, please complete the form below. After reviewing your request, we will get in touch with you promptly to offer the best available solution.