Atomic Force Microscopy (afm) (AFM/STM Multimode)
Atomic Force Microscopy (afm) (AFM/STM Multimode)
Additional information
| MANUFACTURER | Veeco |
|---|---|
| MODEL | AFM/STM Multimode |
Samples
- Samples size: 15 mm maximum
- Thickness: 5 mm maximum
- Lateral resolution : atomic
Analysis
- Modes :
- STM : current feedback
- AFM: contact (deflection feedback) and tapping mode (amplitude feedback)
- Very versatile apparatus, may be configured as Scanning Tunneling Microscope (STM) or as an Atomic Force Microscope (AFM); measurements are performed at ambient atmosphere
Applications
- Routine topographical measurements
- Study of molecules self-organization and their interaction with the substrate
- Material contrast via the detection of friction/adhesion (contact mode) or the cantilever vibration phase (tapping mode)
Characteristics
- Maximum scanning dimensions:
- (STM): X and Y: 500 nm, Z: 200 nm
- (AFM): X and Y: 10 µm, Z: 2.5 µm
- Additional signals available during the scanning: friction (contact mode), phase (tapping mode)
- Cell available for electrochemical measurements in liquid ambient T< 60 °C
ADVANCED TECHNIQUES
- Lateral Magnetic Force Microscopy (MFM)
- Double scan mode with PLL loop to detect and follow the resonance frequency
To use this equipment
The equipment available is accessible to the academic and industrial research community.
To learn about the terms of use and availability, please complete the form below. After reviewing your request, we will get in touch with you promptly to offer the best available solution.