Ellipsometer (VVASE)
Ellipsometer (VVASE)
Additional information
| MANUFACTURER | J.A. Woollam |
|---|---|
| MODEL | VVASE |
Samples
- Sample sizes: maximum 150 mm x 150 mm (6ˮ x 6ˮ)
- Thickness : maximum 1 cm
Analysis
- Measurement of thin films optical constants and thickness (quantitative)
- Mapping possible
- Spectral resolution: 0.05 nm
- Measurements via transmission or reflexion mode
Applications
- Thickness measurement of anisotropic films
- Measurement of dielectric lens transmission
Characteristics
- Wavelengths: from 240 to 2500 nm
- Micrometric sample holder scanning a 45 x 45 mm area on a sample size up to 150 mm
- Ellipsometric analysis across a 20 ºC to 300 ºC temperature range
- Self-retarding plate for depolarization measurement
- Micro-spot objective for a 100 µm beam
Related products
-
Atomic Force Microscopy (afm) (NanoMan VS)
NanoMan VS $0.00 -
Atomic Force Microscopy (AFM) (Multimode 8)
Multimode 8 $0.00 -
Scanning Electron Microscope (sem) (JSM 6300F)
JSM 6300F $0.00 -
Atomic Force Microscopy (afm) (Enviroscope)
Enviroscope $0.00 -
Scanning Electron Microscope (sem) (JSM 7600 TFE)
JSM 7600 TFE $0.00
To use this equipment
The equipment available is accessible to the academic and industrial research community.
To learn about the terms of use and availability, please complete the form below. After reviewing your request, we will get in touch with you promptly to offer the best available solution.